Metrology instrument shortlisted for IET Innovation Awards
Mon, 17 Nov 2014 14:06:00 GMT
The EPSRC Centre is delighted to announce that one of its next generation metrology instruments, a Wavelength Scanning Interferometer, has been shortlisted for an IET (Institution of Engineering and Technology) Innovation Award.
The Wavelength Scanning Interferometer (WSI) is a surface geometry measurement instrument that combines several technologies and is capable of measuring micro and nano-surface geometry in less than half a second. It was developed by Prof Jane Jiang and her team of researchers which includes Dr Haydn Martin, Dr Feng Gao and Dr Hussam Muhamedsalih.
The IET Innovation Awards celebrate the very best innovations in science, engineering and technology. The awards span 16 categories including electronics, healthcare and sustainability; and are judged by a panel of more than 80 esteemed industry and academic experts. With over 400 entries from individuals, industry and academia from across the world, the awards are extremely competitive.
The WSI has been shortlisted in the Manufacturing Technology category. The five finalists in this category are:
- LeddarTech
- MecWash Systems Ltd
- Penn Engineering
- Suzhou Institute of Nanotech, Chinese Academy of Sciences and O-Film Technology Inc
- University of Huddersfield, EPSRC Centre for Innovative Manufacturing in Advanced Metrology.
The awards ceremony takes place on Wednesday 19 November at The Brewery, London. For a full list of all the finalists visit the IET Innovation Awards website.
